Scanning Probe Techniques are a group of advanced methods used to study surfaces at the atomic and molecular levels. These techniques involve scanning a sharp probe over a sample's surface to gather information about its topography, electronic properties, and other characteristics. Common types include Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). These methods provide high-resolution images and data, allowing scientists to analyze materials in various fields, such as nanotechnology, materials science, and biophysics. By manipulating the probe's position and measuring interactions, researchers can gain insights into the physical and chemical properties of different substances.