Atomic Force Microscopy (AFM) is a powerful imaging technique used to visualize surfaces at the nanoscale. It works by scanning a sharp tip attached to a flexible cantilever over a sample's surface. As the tip moves closer to the surface, forces between the tip and the sample cause the cantilever to bend, allowing scientists to create detailed topographical maps of materials, including biological samples and nanostructures. AFM is widely used in various fields, including materials science, biology, and nanotechnology. It provides valuable information about surface properties, such as roughness and mechanical strength, making it essential for research involving nanomaterials and biomolecules.