Atomic Force Microscopy (AFM) is a high-resolution imaging technique used to measure the surface topography of materials at the nanoscale. It operates by scanning a sharp tip attached to a flexible cantilever over a sample's surface. As the tip interacts with the surface, it detects forces between the tip and the sample, allowing for the creation of detailed three-dimensional images. AFM can be applied to a wide range of materials, including biological samples, polymers, and semiconductors. This technique is valuable in various fields such as materials science, biology, and nanotechnology, providing insights into surface properties and structures at the atomic level.