Scanning Tunneling Microscopy (STM) is a powerful imaging technique used to visualize surfaces at the atomic level. It works by scanning a sharp metal tip very close to a conductive surface, allowing electrons to "tunnel" between the tip and the surface. This tunneling current is measured and used to create detailed images of the surface's topography. Developed in the 1980s by Gerd Binnig and Heinrich Rohrer, STM has revolutionized the field of nanotechnology and materials science. It enables scientists to study the properties of individual atoms and molecules, providing insights into their behavior and interactions.