Scanning Tunneling Microscopy (STM) is a powerful imaging technique used to visualize surfaces at the atomic level. It works by scanning a sharp metal tip very close to a conductive surface, allowing electrons to "tunnel" between the tip and the surface. This tunneling current is measured, providing detailed information about the surface's topography and electronic properties. Developed in the 1980s by Gerd Binnig and Heinrich Rohrer, STM has become essential in fields like materials science and nanotechnology. It enables researchers to study individual atoms and molecules, facilitating advancements in areas such as semiconductor development and molecular electronics.