X-ray fluorescence analysis (XRF) is a non-destructive analytical technique used to determine the elemental composition of materials. It works by exposing a sample to X-rays, which causes the elements within the sample to emit their own characteristic fluorescent X-rays. By measuring these emitted X-rays, scientists can identify and quantify the elements present in the sample. XRF is widely used in various fields, including geology, archaeology, and materials science. Its ability to analyze solid, liquid, and powdered samples makes it a versatile tool for quality control, environmental monitoring, and research applications.