Scanning Probe Microscopy (SPM) is a powerful technique used to visualize surfaces at the atomic or molecular level. It works by scanning a sharp probe over a sample's surface, measuring interactions between the probe and the sample. This allows researchers to obtain high-resolution images and gather information about the sample's properties, such as topography and electrical characteristics. There are several types of SPM, including Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM). Each type utilizes different principles to achieve imaging and analysis. SPM is widely used in materials science, biology, and nanotechnology for studying various materials and structures.