Transmission electron microscopy (TEM) is a powerful imaging technique used to observe the internal structure of materials at the atomic level. It works by transmitting a beam of electrons through a very thin sample. As the electrons pass through, they interact with the sample, producing an image that reveals fine details of the material's composition and structure. TEM is widely used in various fields, including materials science, biology, and nanotechnology. By providing high-resolution images, it allows researchers to study the arrangement of atoms, identify defects, and analyze the properties of different materials, contributing to advancements in science and technology.