Scanning Electron Microscopy (SEM) is a powerful imaging technique that allows scientists to observe the surface of samples at a very high resolution. Unlike traditional light microscopes, which use visible light, SEM uses a focused beam of electrons to scan the surface of a specimen. This process creates detailed, three-dimensional images, revealing fine structures and textures that are often invisible to the naked eye. One of the key advantages of SEM is its ability to analyze a wide range of materials, from biological samples like cells to industrial materials like metals. Researchers often use SEM in fields such as materials science, biology, and nanotechnology to gain insights into the properties and behaviors of different substances at the microscopic level.