Scanning electron microscopy (SEM) is a powerful imaging technique used to observe the surface structure of materials at a very high resolution. It works by scanning a focused beam of electrons across a sample, which then emits secondary electrons that are collected to create detailed images. SEM can achieve magnifications of up to 1,000,000 times, allowing scientists to study the fine details of surfaces and materials. This method is widely used in various fields, including materials science, biology, and nanotechnology. SEM provides valuable information about the morphology, composition, and topography of samples, making it essential for research and quality control in industries such as electronics and pharmaceuticals.