Field Emission Scanning Electron Microscopy (FESEM) is a type of electron microscopy that provides high-resolution images of surfaces. It uses a field emission source to generate a focused beam of electrons, which scans the sample's surface. This technique allows for detailed imaging of materials at the nanoscale, making it valuable in various scientific fields. FESEM is particularly useful for studying the morphology and topography of samples, such as metals, semiconductors, and biological specimens. The high resolution and depth of field offered by FESEM enable researchers to analyze surface features and structures with great precision, aiding in material characterization and development.