A scanning electron microscope (SEM) is a powerful tool used to observe the surface of samples at a very high magnification. Unlike traditional light microscopes, which use visible light, SEMs use a focused beam of electrons to create detailed images. This allows scientists to see the fine structures of materials, such as metals, biological specimens, and polymers, with resolutions down to nanometers. The images produced by SEM are three-dimensional and provide valuable information about the sample's topography and composition. SEMs are widely used in various fields, including materials science, biology, and semiconductor manufacturing, making them essential for research and quality control.