The Van Der Pauw Method is a technique used to measure the electrical properties of thin, flat samples, such as semiconductors and metals. It involves placing four electrical contacts on the periphery of the sample and applying a current through two contacts while measuring the voltage across the other two. This method allows for the determination of sheet resistance and carrier concentration. This technique is particularly useful because it can be applied to samples of various shapes, as long as they are homogeneous and isotropic. The Van Der Pauw formula provides a way to calculate resistivity and other important parameters, making it a valuable tool in materials science and engineering.