Optical Profilometry is a non-contact measurement technique used to analyze the surface topography of materials. It employs light, often from a laser, to capture detailed images of a surface's height variations. This method is particularly useful in industries like semiconductors and materials science, where precise surface measurements are critical. The process involves illuminating the surface and measuring the reflected light to create a 3D map of the surface features. Optical Profilometers can detect minute changes in height, making them ideal for applications such as quality control and research in nanotechnology and microfabrication.