Atomic Force Microscopy (AFM) is a powerful imaging technique used to visualize surfaces at the nanoscale. It works by scanning a sharp tip attached to a flexible cantilever over a sample's surface. As the tip interacts with the surface, it detects forces between the tip and the sample, allowing for the creation of detailed topographical maps. AFM is widely used in various fields, including materials science, biology, and nanotechnology. It can provide information about surface roughness, mechanical properties, and even molecular interactions. This versatility makes AFM a valuable tool for researchers studying materials like nanoparticles and biomolecules.