White light interferometry is a technique that uses the interference of light waves to measure small distances or changes in surface profiles. It involves splitting a beam of white light into two paths: one reflects off a sample surface, while the other reflects off a reference surface. When the two beams recombine, they create an interference pattern that can be analyzed to determine precise measurements. This method is particularly useful in fields like optics and metrology, where high-resolution measurements are essential. By analyzing the interference fringes, scientists can detect minute variations in surface height, making it valuable for applications in semiconductor manufacturing and biomedical imaging.