Atomic force microscopy (AFM) is a type of scanning probe microscopy that provides high-resolution images of surfaces at the nanoscale. It works by using a tiny probe attached to a flexible cantilever that scans the surface of a sample. As the probe moves closer to the surface, forces between the probe and the sample cause the cantilever to bend, allowing for precise measurements of surface topography. AFM can be used to study a variety of materials, including biological samples, polymers, and semiconductors. It is particularly valuable in fields like materials science and nanotechnology, where understanding surface properties at the atomic level is crucial for research and development.