Wavelength Dispersive X-ray Spectroscopy (WD-XRS) is an analytical technique used to determine the elemental composition of materials. It works by directing X-rays onto a sample, which causes the elements in the sample to emit secondary X-rays. These emitted X-rays are then analyzed based on their wavelengths, allowing scientists to identify and quantify the elements present. WD-XRS is particularly useful in fields like geology, materials science, and archaeology. It offers high resolution and sensitivity, making it effective for analyzing complex mixtures and trace elements. This technique is often employed in conjunction with other methods, such as Scanning Electron Microscopy (SEM), for comprehensive material characterization.