A Scanning Electron Microscope (SEM) is a powerful tool used to observe the surface structure of materials at a very high magnification. Unlike traditional light microscopes, SEM uses a focused beam of electrons to scan the sample, producing detailed images with a resolution down to a few nanometers. This allows scientists to study the fine details of various materials, including metals, biological specimens, and polymers. The images generated by SEM provide valuable information about the sample's topography and composition. SEM is widely used in fields such as materials science, biology, and nanotechnology, helping researchers understand the properties and behaviors of different substances at the microscopic level.