A scanning electron microscope (SEM) is a powerful tool used to observe the surface of samples at a very high magnification. Unlike traditional light microscopes, SEM uses a focused beam of electrons to scan the surface, producing detailed images that reveal the texture and composition of materials. This technique allows scientists to study a wide range of samples, from biological specimens to industrial materials. SEM provides three-dimensional images with excellent depth of field, making it ideal for analyzing the fine details of structures. It is commonly used in fields such as materials science, biology, and nanotechnology, helping researchers understand the properties and behaviors of various substances at the microscopic level.