A Scanning Electron Microscope (SEM) is a powerful tool used to observe the surface structure of materials at a very high magnification. Unlike traditional light microscopes, SEM uses a focused beam of electrons to scan the sample, producing detailed images with a resolution down to a few nanometers. This allows scientists to study the fine details of various materials, including metals, biological specimens, and polymers. SEM can also provide information about the composition of the sample through techniques like Energy Dispersive X-ray Spectroscopy (EDS). This capability makes it valuable in fields such as materials science, biology, and nanotechnology, where understanding surface features and elemental composition is crucial for research and development.