Electrical Overstress (EOS) occurs when an electronic component is exposed to voltage or current levels beyond its specified limits. This excessive electrical stress can lead to permanent damage, affecting the component's performance and reliability. Common causes include voltage spikes, incorrect power supply connections, or static electricity discharges. EOS can result in various failure modes, such as short circuits, open circuits, or degraded functionality. To prevent EOS, proper design practices, protective devices, and careful handling during manufacturing and installation are essential. Understanding and mitigating EOS is crucial for ensuring the longevity of electronic devices and systems.