An Atomic Force Microscope (AFM) is a type of scanning probe microscope that provides high-resolution images of surfaces at the atomic level. It works by using a tiny probe, or cantilever, that moves across the sample's surface. As the probe approaches the surface, forces between the probe and the sample cause the cantilever to bend, allowing the AFM to measure topography and other properties. AFMs can analyze a variety of materials, including biological samples, polymers, and semiconductors. They are widely used in fields such as nanotechnology, materials science, and biophysics for research and development, enabling scientists to study structures and interactions at an incredibly small scale.