The Test Access Port (TAP) is a standardized interface used in electronic devices to facilitate testing and debugging. It allows engineers to access the internal signals of a device without needing to modify the hardware. This is particularly useful for verifying the functionality of integrated circuits and ensuring they operate correctly. TAP is part of the Joint Test Action Group (JTAG) standard, which provides a method for testing printed circuit boards after manufacture. By using TAP, developers can perform boundary-scan testing, enabling them to identify faults and improve the reliability of electronic systems.