The Binet-Simon scale is an early intelligence test developed by French psychologists Alfred Binet and Théodore Simon in the early 20th century. It was designed to identify children who needed special educational assistance. The scale measures various cognitive abilities, including reasoning, problem-solving, and comprehension, through a series of tasks and questions. This scale laid the groundwork for modern intelligence testing and was later revised into the Stanford-Binet Intelligence Scales by Lewis Terman. The Binet-Simon scale introduced the concept of the intelligence quotient (IQ), which compares an individual's mental age to their chronological age, providing a standardized measure of intelligence.