The Binet-Simon Test is an early intelligence test developed by French psychologists Alfred Binet and Théodore Simon in the early 20th century. It was designed to identify children who needed special educational assistance. The test measures various cognitive abilities, including reasoning, problem-solving, and comprehension. The Binet-Simon Test introduced the concept of an intelligence quotient (IQ) and laid the groundwork for future intelligence testing. It assesses a child's mental age compared to their chronological age, helping educators tailor learning strategies to individual needs. This test has influenced many modern intelligence assessments.